Pavan Singaraju: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Novel quantum wire infrared photodetectors

Biswajit Das, Pavan Singaraju

Journal:

Infrared Physics & Technology

Year:

2005

Language:

english

File:

PDF, 581 KB

english, 2005

2

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Voltage dependence and AC life time of PMOS HCI

Jia, James Yingbo, Liu, Patty, Xue, Fengliang, Tien, Jon, Cai, Alex, Dhaoui, Fethi, Singaraju, Pavan, Hawley, Frank, McCollum, John

Year:

2013

Language:

english

File:

PDF, 555 KB

english, 2013

3

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - NBTI life time of a high voltage PMOS FET

Jia, James Yingbo, Xue, Fengliang, Liu, Patty, Tien, Jon, Cai, Alex, Dhaoui, Fethi, Singaraju, Pavan, Hawley, Frank, McCollum, John

Year:

2013

File:

PDF, 176 KB

2013

4

Novel nonlithographic quantum wire array fabrication

Biswajit Das, Pavan Singaraju

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2007

Language:

english

File:

PDF, 1.07 MB

english, 2007

5

Modeling of programming time of nanocrystal flash memory cells

Pavan Singaraju, Rama Venkat

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2008

Language:

english

File:

PDF, 527 KB

english, 2008

6

Modeling of the charging dynamics in silicon nanocrystal nonvolatile flash memory cells

Pavan Singaraju, Rama Venkat

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2008

Language:

english

File:

PDF, 222 KB

english, 2008

7

[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - High voltage PMOS FET NBTI results and mechanism

Jia, James Yingbo, Liu, Patty, Xue, Fengliang, Tien, Jon, Cai, Alex, Dhaoui, Fethi, Singaraju, Pavan, Hawley, Frank, McCollum, John

Year:

2013

Language:

english

File:

PDF, 352 KB

english, 2013

8

[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - User verify and disturb mechanisms in a 65nm flash FPGA

Jia, James Yingbo, Singaraju, Pavan, Dhaoui, Fethi, Newell, Rich, Liu, Patty, Micael, Habtom, Traas, Michael, Sammie, Salim, Wang, J. J., Hawley, Frank, McCollum, John, den Abeelen Werner, Van, Hamdy,

Year:

2011

Language:

english

File:

PDF, 306 KB

english, 2011

9

[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Performance and reliability of a 65nm Flash based FPGA

Jia, James Yingbo, Singaraju, Pavan, Dhaoui, Fethi, Newell, Rich, Liu, Patty, Micael, Habtom, Traas, Michael, Sammie, Salim, Hawley, Frank, McCollum, John, den Abeelen Werner, Van

Year:

2012

Language:

english

File:

PDF, 302 KB

english, 2012

10

[IEEE 2012 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2012.10.14-2012.10.18)] 2012 IEEE International Integrated Reliability Workshop Final Report - Program disturbs and process optimization in a 65 nm Flash FPGA

Jia, James Yingbo, Singaraju, Pavan, Micael, Habtom, Liu, Patty, Sammie, Salim, Dhaoui, Fethi, Hawley, Frank, Ren, Chi, Li, Zhi Guo, Toh, Boon Keat, Li, Zhao Bing, Chang, Tzu-Yun, Gau, Jing Horng, She

Year:

2012

Language:

english

File:

PDF, 317 KB

english, 2012

11

[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Flash-Based FPGA TID and Long-Term Retention Reliability through VT Shift Investigation

Wang, Jih-Jong, Rezzak, Nadia, Dsilva, Durwyn, Xue, Fengliang, Samiee, Salim, Singaraju, Pavan, Jia, James, Hawley, Frank, Hamdy, Esmat

Year:

2015

Language:

english

File:

PDF, 945 KB

english, 2015

12

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Template based nanofabrication: mechanical characterization of film-substrate interface

Das, Biswajit, Singaraju, Pavan, Lopez, Jose F., Quan, Chenggen, Chau, Fook Siong, Fernandez, Francisco V., Lopez-Villegas, Jose Maria, Asundi, Anand, Wong, Brian Stephen, de la Rosa, Jose M., Lim, Ch

Year:

2012

Language:

english

File:

PDF, 987 KB

english, 2012